Novel Microscopy Development

Scanning electron microscopy image of tin balls

Jump to:

APERTURELESS NEAR-FIELD SCANNING OPTICAL MICROSCOPY (ANSOM)

As the requirement for viewing images at high spatial resolutions increases, the complexity in the imaging tools also increases. The near-field nanoprobe is one of the nanometrological tools capable of seeing at the nanoscale and is a relatively modern tool compared to the conventional optical and electron microscopes. Chemical etching, electron/focused ion beams, and carefully applied thin-film deposition techniques make it possible to fabricate very high-resolution imaging probes. These systems are capable of detecting fluorescence, Raman, and other nonlinear signals at spatial resolutions previously thought impossible.

 

Drawing of microscope

Explore ANSOM Project

The goal for the project is to develop a versatile tool for nanometrology. Our original motivation was to build an open source microscope from the ground up that is able to obtain high-resolution optical imaging.

Atomic Force Microscopy (AFM)

Shown below is an Atomic Force Microscope (AFM). The sample is scanned or rastered in a rectangular pattern in the XY plane while the tip is maintained at a constant Z-distance from the sample. The Z-position which is required to keep the tip at a constant distance is recorded synchronously with each XY point in the raster. This information can then be displayed as an intensity on a grey scale and used to produce a topgrapghical image of the sample's surface.

Back to top 

Field Enhancement

Microscopy as a field is oftentimes plagued by the problem of a low signal to noise ratio.  It is always desirable when imaging to remove unwanted signals, while amplifying the desirable signals.  Near-field microscopy is no exception.  For Tip Enhanced Near-field Optical Microscopy (TENOM) doing fluorescence spectroscopy, signal to noise amplification is highly desirable for higher resolution imaging.  We work on two ways in which to achieve this goal; one, by filtering out the unwanted signal from the illumination source, through the addition of an aperture in the collection optical pathway, and/or by amplifying the signal produced by the probe at the sample. The second method is by creating a resonant geometry, by which the field enhancement can be drastically increased, while keeping the background constant. By looking at the nano-probe as a nano-antenna (or nantenna), past irreproducibilities can be explained, and dimensions for the fabrication of a reproducible probe, based on the desirable wavelength, are predictable, through the use of finite difference time domain modeling of the potential geometries.  The maximization of the field enhancement is also dependent on the location at which the illumination focal volume is placed relative to the geometry.  A method for the testing of the effectiveness of the nano-probes has been developed in our group, as well as a reliable method of probe fabrication. 

Raman (TENOM, TERS)

Raman lines provide a great deal of information about how the sample is put together or attached to something else; it is based on the slight conformational changes of bonds (phonons) moving with respect to incoming light. There are vibrational modes and rotational degrees of freedom which can be probed to determine the nanoscale structure, but there is a drawback normally. Although the technique doesn’t have the problem of photobleaching like fluorescence is often plagued with, the signal tends to be very weak. Therefore the laser power is typically is very high in order to see the emission. Ways to get around this in normal Raman microscopy is to put metal nanoscale colloids of Ag and Au in order to enhance the signal (surface enhanced Raman spectroscopy SERS). We do a similar concept with a strongly enhanced field at the end of a probe tip. The probe tip excites different lines of the bond structures beneath it.

Tip Enhanced/farfield Multi-photon Fluorescence

Representation of the tip-enhanced method typically used in our group. There are different methods to excite surface charges in tips; we focus on the concept of nano-antenna resonances and resonance particle plasmons.

Back to top 

Multi-Photon Excitation

Multi-photon excitation is a process in which an atom or molecule is excited by the absorption of multiple photons instead of a single photon. A simplified cartoon representation of this process can be seen below.

The figure shows the absorption of one, two, and three photons to an excited state Si from the ground state, followed by a non radiative transition to an intermediate state S1 before transitioning back to the ground state and emitting a photon in the process. This figure shows the process as one where the multiple photon absorption involves photons of one half or one third of the energy, per photon, required to make the transition to the excited state. The two or more photons must arrive within a time span on the order of a single femtosecond (10-15 s), thus requiring very high photon flux.

The images below show scanning fluorescence images of 4 different fluorophores, each imaged with the same excitation source: a 50 fs pulsed ti:sapphire laser with a center wavelength of 830 nm with a full width half max of 14 nm.

 

You may notice that none of the absorption maxima are at wavelengths of half that of the excitation source. This suggests that the above cartoon may need some modification. Indeed, a more accurate version involves the excitation to a quasi-state, beyond the excited state Si, from which it undergoes non-radiative relaxation to the excited state. A modified excitation-radiation scheme is shown below.

The excitation of fluorophores to a quasi-state allows for excitation of multiple fluorophores using the same excitation source providing a major benefit in comparison to single photon excitation. The images below show simultaneous excitation of three fluorophores, each one acting as a label for a different cellular structure.

 In addition to the added benefit of simultaneously imaging dyes with different absorption characteristics, multi-photon fluorescence microscopy also reduces the need for spatial filtering of the fluorescence signal. Traditional confocal fluorescence microscopy requires the use of an aperture in the image plain of the microscope in order to spatially discriminate the signal to reduce background because of the large excitation volume. By contrast, multi-photon excitation has an inherently small focal volume due to the requirement of high photon densities. A comparison of excitation volumes between single and multi-photon is shown below.

The figure above shows a comparison between single photon (left) and multi-photon (right) excitation volumes, shown in green. Here you see the excitation volume is restricted to the focal volume leading to the inherent spatial discrimination along the direction of excitation source’s propagation. This is what allows for the reduction or elimination of the need for an aperture in the image plane for noise reduction as only those fluorophores within the small excitation volume.

Back to top

NEUTRAL ATOM MICROSCOPY (NAM)

Scanning surfaces using a beam of noncharged atoms or molecules allows for especially nondestructive and low-energy surface imaging, with the potential to obtain new information about surfaces that cannot be easily obtained otherwise. We have developed a new approach, operating with the sample at a close working distance from an aperture, the need for optics to focus the beam is obviated. Compared to more complex approaches, the theoretical performance has no other disadvantage than the short working distance. Resolution of 1.5 μm has been achieved, and submicron resolution appears to be practical. Construction of the microscope and results are presented, including first images done in reflection mode, theory for optimization of the design and avenues for future improvement.

ELECTRON AND ION MICROSCOPIES

Our group designs a lot of prototype systems utilizing electron and Ion beams, we use these microscopes to teach students how these machines work. In addition, novel emitter sources and attachments have been invented by our group to increase the usefulness of these systems for use as educational tools as well as novel research tools.

Combined AFM FIB

The goal of this project is to develop an inexpensive AFM-SIMS system which can be adapted to virtually any FIB-SIMS. The output for this AFM-SIMS system is a movie of a milling process, which is accurate in the Z-dimension. Volumetric resolution is targeted to be less than 50 nm per voxel, the limitation being primarily due to the FIB/SIMS resolution. Currently under hardware development by Rich Swinford.

Focused Ion Microscopy

The Focused Ion beam (FIB) uses a stream of Ga ions to image or mill the surface of a sample. Operating much like an SEM, the beam of ions are rastered scanned over the surface with a variable width, speed, and intensity. The Ga ions can have an intensity of 5-30 eV. High intensities cause the surface of the sample to be milled or sputtered away. As shown in the image below, the milling process is similar to shooting a shotgun at a brick wall. Typical beam currents range from 50 pA to 5 nA. Beam diameters can range from 5 nm to more than 1 micron. Neutrals, ions and electrons are all generated when Ga ions impact the sample.

Secondary Ion Mass Spectometry (SIMs)

Secondary Ion Mass Spectrometry (SIMs) allows the identification and mapping of materials present in thin films. This is achieved by collecting and measuring the ion products during FIB imaging or milling. As shown in the image below the spectra for Ga, Ti, and Al is measured. By knowing the location of the ion beam when the Al or Ti ions are detected allows the operator to individually map their location on the surface. All detected Ga ions by the mass spec are leftovers from the imaging process. The map of Ti an Al can then be combined to produce a single image displaying the composition of the thin film. 

Top left, Ti mapping; top right, Al mapping; bottom, combined Ti Al mapping

Back to top