ME 428/528 Scanning Electron Microscopy for Materials and Device Characterization

An introduction to theoretical and practical concepts of scanning electron microscopy (SEM) and spectroscopy. Topics studied include electron optical principles of SEM, specimen preparation, and SEM imaging and interpretation. The spectroscopy of microanalysis covers qualitative and quantitative chemical analysis of materials and devices. Through hands-on SEM operation, students will become proficient in the application of SEM and EDX systems.  

This course is offered in the Winter term. 

ME 429/529 Transmission Electron Microscopy and Chemical Analysis

An introduction to theoretical concepts and practical applications of transmission electron microscopy (TEM) and spectroscopy for materials characterization. The imaging techniques include TEM and STEM bright field and dark field imaging, the contrast mechanism, electron diffraction, and sample preparations.  The chemical analysis techniques include energy dispersive X-ray spectroscopy and electron energy loss spectroscopy. The lab provides hands-on experiences for students to operate the state-of-the-art TEM and the attached analytical accessories. 

This course is offered in the Spring term.

ME 410/510 Material Surface Analysis: The Principal Techniques and Applications

An introduction to several surface analysis techniques that are essential for the understanding of the properties and reactivity of material surfaces. The analytical techniques include AFM/STM, ESCA/XPS, Raman spectroscopy, etc. The theoretical principles in relation to their applications in characterization of materials’ physical topography, the chemical composition, the chemical structure, the atomic structure, the electronic state, and the bonding of molecules at the surface will be discussed.

This course is offered in the Fall term.