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Meet Professor Robert Daasch
Meet Professor Robert Daasch


W. Robert Daasch, Ph.D., Professor, Electrical and Computer Engineering


Robert Daasch, Ph.D., professor and director of the Integrated Circuits (IC) Design and Test Laboratory, came to Portland State University in 1986. He has a Ph.D.  in chemistry, University of Washington, and B.S. in chemistry with high scholarship, Oregon State University.

Upon completing his Ph.D., Dr. Daasch did post-doctorate research for semiconductor group for two years, gaining experience in the semiconductor field. He was a visiting professor for the next two years at the Illinois Institute of Technology.

At PSU’s Maseeh College of Engineering and Computer Science, he teaches senior and graduate level courses in digital VLSI (very large-scale integration) design and semiconductor test. His students have landed jobs at Texas Instruments, Inc.; IBM Corporation; Micron Technology, Inc.; Tektronix, Inc.; Intel Corporation; Credence Systems Corporation; and Mentor Graphics.

In the area of the semiconductor test, the ICDT Laboratory has had many leading companies as research partners. The Semiconductor Research Corporation supported ICDT research for over 10 years, Texas Instruments has adopted many of the techniques originally developed in the ICDT for many product families and over 1000 different products. Globalfoundaries (including IBM Microelectronics) has supported ICDT research with grants and in-kind contributions of test time and semiconductor test data.

Dr. Daasch is considered an expert in integrated circuit design. In 2008 Dr. Daasch and ICDT graduate students Liwei Ning and Amit Nahar received the Semiconductor Research Corporation’s Technical Excellence Award for their research titled “Burn-in Reduction: Improving Outlier Screening.” In 2008 Dr. Daasch was awarded the Sigma XI’s Oregon Engineering Researcher of the Year. In addition to best paper awards in October 2006, he was a plenary invited speaker at the International Text Conference in Santa Clara, California. His talk is featured in the following news articles: “ITC: Testing new nanomaterials,” Test & Measurement World website, October 2006; and “Test challenges could trump future chip designs, expert warns,” EE Times, October 2006.

Dr. Daasch’s professional memberships include IEEE (Institute of Electrical and Electronics Engineers), Sigma Xi Society, Phi Kappa Phi, IEEE Circuits and Systems Society, IEEE Microwave Theory and Techniques Society, and IEEE Electron Devices Society. He also serves on the technical board for PSU’s Center for Electron Microscopy.

Ultimately, Robert Daasch loves the life of a professor, which is not surprising as he comes from a three-generation legacy of educators. His grandfather was a mechanical engineering professor and he remembers growing up surrounded by Ph.D. students.