The Department of Electrical and Computer Engineering (ECE) at PSU's Maseeh College of Engineering and Computer Science presents as part of the ECE507 Seminar Winter 2006 Series: Circuit Reliability Challenges.
Title: "Circuit Reliability Challenges"
Speaker: Jack Pippin, Principal Engineer, Product Reliability Group, Intel Corporation
Date: January 27, 2006
Time: 2:00 - 3:00 p.m.
Location: 102EB, Fariborz Maseeh Auditorium, New Engineering Building, 1930 SW Fourth Avenue, Portland, Oregon 97201 (E-10 on map)
This series is free and open to the public. For further information, contact the Department of Electrical and Computer Engineering, (503) 725-3806 or firstname.lastname@example.org.
For more information on upcoming seminars, please visit the Department Web site: http://www.ece.pdx.edu/ece.507.graduate.seminar.schedule/current.htm
Today's engineers need to focus on how to do a robust design while being faced with reliability and process challenges such as: HCI (hot carrier injection), NBTI (negative-bias thermal instability), TDDB (time dependant dielectric breakdown), EM (electromigration), SER (soft error rate), temperature, and supply excursions including MinVcc issues. The theory of some of these phenomena has existed for decades while others are relatively new. This seminar will present an overview of each phenomenon as well as covering the techniques and methodologies which can be used to make optimal design decisions. Practical analytical design methods will be discussed for each of the above areas along with examples of tools that are available.