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VersaProbe II XPS/AES

We have successfully installed VersaProbe II. The system equipped with Ar and C60 sputtering gun, dual charge neutralizer etc, provides high performance XPS large area spectroscopy, superior micro-area spectroscopy, chemical imaging, and secondary electron imaging with a raster scanned 10 µm diameter x-ray beam. It is suitable for surface composition, chemical state, electronic structure analysis.