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Poly-Si/Si Interface taken with TECNAI F20 TEM. Sample prepared with Strata 237 Dual Beam FIB
Tony Chen.


Diatom in TEM (TECNAI F20)
Tony Chen


Carbon Nanotube taken with TECNAI F20 TEM
Chunfei Li.


EFTEM Si-N-O Map with TECANI F20 TEM, Sample prepared with Strata 237 Dual Beam FIB
Tony Chen


EELS spectrum of B, P, C. with TECNAI F20 TEM
Tony Chen.


Defect on Fe3O4 nanoparticles taken with TECNAI F20 TEM
Tony Chen




STEM ADF Image of Tissue taken with TECNAI F20 TEM
Tony Chen


STEM ADF image of Cell tissue taken with TECNAI F20 TEM
Tony Chen