Materials Microstructure and Microanalysis Workshop 2010
Materials Microstructure and Microanalysis
October 18~20th 2010
The Center for Electron Microscopy and Nanofabrication cordially invites you to attend our 3-day Materials Microstructure and Microanalysis Workshop including lectures and hands-on practice of different microscopy techniques. Topics will include:
- Analytical TEM, including (S)TEM/BF/DF imaging and EDX and EEbL spectroscopies
- Analytical SEM, including BSE/CL imaging and EDX and WDX spectrocopies
- Dual Beam FIB, including TEM specimen preparation, serial sectioning and EDX spectroscopy
Technical tutorial lectures on general microstructure and microanalysis theory will be given by FEI, Oxford Instrument, Gatan, Zeiss application engineers, and PSU faculty each morning, followed by TEM, SEM, and FIB practice sessions each afternoon of October 18th~20th 2010 . Maximum 30 participants are allowed to attend the lectures only. Due to microscope availability, registration for practice sessions will be limited to total 12 in four groups with 3 participants in each group. Please register as soon as possible if you are interested in the practice sessions. Acceptance will be on a first come, first served basis.