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Application Notices
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The microscope is designed for both high resolution (Point resolution: 2.4Å) and analytical microscopy (energy resolution: 0.9eV). The microscope is equipped with: (1) Gatan DF/BF detector for STEM; (2) Gatan GIF 2001 system for EELS and EFTEM; (3) EDAX EDX detector for chemical information; (4) Gatan ultrascan CCD (2kx2k); (5) Oxford cryo- holder. It is ideal for micro and nano probe work including: HAADF STEM, nanodiffraction, spatially resolved EELS and EDS, HREM, EFTEM etc.
Key features
- HT: 80~200kV
- Point resolution: 2.4Å
- STEM resolution: 1.9Å
- Energy resolution: 0.9eV
- TEM Magnification: 25x~1030kx
- STEM Magnification :10K~230M
- Tilt: ±40°
Attachment
- Gatan GIF 2001
- Cryo-holder
- EDAX EDX detector
Application
- TEM/STEM imaging
- Diffraction
- EFTEM
- EDX/EELS composition analysis
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CEMN has a new profilometer installed
CEMN has a new Zeiss Sigma VP SEM installed with EDS and WDS
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