Search Google Appliance


FEI Sirion XL30 FEG SEM

Become a new user

Apply for training

Request services

Make a reservation

Find instrument manual

Find an instrument

Application Notices

ONAMI Matching Grant

Contact CEMN Staff

 

A field emission high resolution SEM equipped with Oxford EDS. The microscope can be operated both at low accelerating voltage (200V) and high accelerating voltage (30kV). The immersion lens technique pushes the resolution to nm order while complete computer control guarantees user friendly operation.

 

Key Features

  • HT: 500V~30kV
  • Resolution: 1.5nm
  • Vacuum: High Vacuum
  • Magnification: 36x~800kx
  • Tilt: -15° to +75°
  • Rotation: 0 to 360 degree

Attachment

  • INCA EDX detector

 

Application

  • SE imaging and EDX
  • EDX composition analysis

Links

Events
Microstructure and Microanalysis Workshop...

News

CEMN has a new profilometer installed

CEMN has a new Zeiss Sigma VP SEM installed with EDS and WDS